The Sindex™ chip is a 4×4 mm silicon substrate containing topographically defined pads that are arrayed within an alphanumeric indexing system. The pads are flat and smooth, making them ideal for fluorescence microscopy and atomic force microscopy. The indexing system allows precise location and relocation of specific positions on the chip. There are three patterned regions on each chip: 50 µm, 100 µm, and 200 µm. The chips are coated with 10 nm of titanium nd 20 nm of gold, silver, platinum, titanium or nickel before being functionalized.
Sindex™ chips are offered in two grades:
AFM grade—one out of every 10 chips will be imaged by AFM to ensure that they meet the roughness specification and no particles are larger than 20 nm.
Optical grade—one out of every 10 chips inspected by optics and no particles present are larger than 1 mm.